Publication: Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films
Loading...
Date
Advisor
Coadvisor
Graduate program
Undergraduate course
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier B.V.
Type
Article
Access right
Acesso restrito
Abstract
Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale. (C) 2014 Elsevier Ltd. All rights reserved.
Description
Keywords
Thin films, Chemical synthesis, Atomic force microscopy
Language
English
Citation
Materials Research Bulletin, v. 61, p. 26-31, 2015.
