Phase-Locked Loop design applied to frequency-modulated atomic force microscope
Carregando...
Arquivos
Fontes externas
Fontes externas
Data
Orientador
Coorientador
Pós-graduação
Curso de graduação
Título da Revista
ISSN da Revista
Título de Volume
Editor
Elsevier B.V.
Tipo
Artigo
Direito de acesso
Acesso restrito
Arquivos
Fontes externas
Fontes externas
Resumo
The atomic force microscope (AFM) introduced the surface investigation with true atomic resolution. In the frequency modulation technique (FM-AFM) both the amplitude and the frequency of oscillation of the micro-cantilever must be kept constant even in the presence of tip-surface interaction forces. For that reason, the proper design of the Phase-Locked Loop (PLL) used in FM-AFM is vital to system performance. Here, the mathematical model of the FM-AFM control system is derived considering high order PLL In addition a method to design stable third-order Phase-Locked Loops is presented. (C) 2010 Elsevier B.V. All rights reserved.
Descrição
Palavras-chave
Frequency-modulated atomic force microscopy, Phase-Locked Loops, Nonlinear dynamics, Mathematical model
Idioma
Inglês
Citação
Communications In Nonlinear Science and Numerical Simulation. Amsterdam: Elsevier B.V., v. 16, n. 9, p. 3835-3843, 2011.
