Publicação: Structural modifications in stretch-induced crystallization in PVDF films as measured by small-angle X-ray scattering
Carregando...
Data
Orientador
Coorientador
Pós-graduação
Curso de graduação
Título da Revista
ISSN da Revista
Título de Volume
Editor
Wiley-Blackwell
Tipo
Artigo
Direito de acesso
Acesso restrito
Resumo
The nanostructure of stretched and nonstretched PVDF samples was studied by small-angle X-ray scattering (SAXS). The crystallinity of the samples was determined by wide-angle X-ray diffraction (WAXD) and differential scanning calorimetry (DSC), and crystalline phases by Fourier transform infrared spectroscopy (FTIR). The nanostructure can be described by a lamellar stacking of crystalline and amorphous layers, with a fairly well defined long period D and a diffuse-boundary in the interface between the crystalline and amorphous phases. The crystallinity of the stretched sample was found to be greater than that of the nonstretched sample. The long period D and the thicknesses of the crystalline lamellae Tc were found to be greater in the stretched sample than those in the nonstretched sample. The thickness of the diffuse-boundary was evaluated as being similar to 1.4 nm in the nonstretched sample and 1.1 nm in the stretched sample. It was concluded that the growth of the thickness of the crystalline layer induced by the stretching process (stretch-induced crystallization) occurs partially at expense of the diffuse boundary and also by the coarsening of the structure with the stretching process, because of the diminution in the surface area to volume ratio observed. (C) 2011 Wiley Periodicals, Inc. J Appl Polym Sci, 2012
Descrição
Palavras-chave
poly(vinylidene fluoride) (PVDF), crystalline-amorphous interface, SAXS, diffuse boundary, stretching
Idioma
Inglês
Como citar
Journal of Applied Polymer Science. Malden: Wiley-blackwell, v. 125, n. 1, p. 527-535, 2012.
