Publication: Morphology of alumina: a comparison between infrared spectroscopy and X-ray diffractometry
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Date
1999-05-01
Advisor
Coadvisor
Graduate program
Undergraduate course
Journal Title
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Volume Title
Publisher
Elsevier B.V.
Type
Article
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Acesso restrito
Abstract
Morphology of three samples of alumina are investigated. Infrared spectra are analysed by use of their morphology through the theory of average dielectric constant. Crystal shape is obtained from X-ray diffraction patterns by reflection intensity ratio. In the case of electron scanning microscopy, shape factor was obtained by an average axial ratio of the particles. Comparison of results show that there is agreement among these techniques and infrared spectra can be used to determine the morphology of alumina particles from 2.7 to 10 mu m, even for heterogeneous samples. (C) 1999 Elsevier B.V. B.V. All rights reserved.
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Language
English
Citation
Journal of Non-crystalline Solids. Amsterdam: Elsevier B.V., v. 247, p. 227-231, 1999.
