Pyrosol preparation and structural characterization of SnO2 thin films
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Data
2003-12-20
Autores
Tucic, A.
Marinkovic, Z. V.
Mancic, L.
Cilense, M.
Milogevic, O.
Título da Revista
ISSN da Revista
Título de Volume
Editor
Elsevier B.V.
Resumo
Polycrystalline tin oxide thin films were prepared from ethanol solution of SnCl2.H2O (concentrations: 0.05, 0.1, 0.2 and 0.4 mol/dm(3)) at different substrate temperatures ranging from 300 to 450 degreesC. The kinetic deposition processes were studied in terms of various process parameters. The crystal phases, crystalline structure, grain size and surface morphology are revealed in accordance to X-ray diffractometry and scanning electron microscopy (SEM). Texture coefficients (TCs) for (110), (2 0 0), (2 11) and (3 0 1) reflections of the tetragonal SnO2 were calculated. Structural characteristics of deposited films with respect to varying precursor chemistry and substrate temperature are presented and discussed. (C) 2003 Published by Elsevier B.V.
Descrição
Palavras-chave
pyrosol process, crystal structure, surface morphology, tin oxide films
Como citar
Journal of Materials Processing Technology. Lausanne: Elsevier B.V. Sa, v. 143, p. 41-45, 2003.