Metal-Organic Semiconductor Nanostructures for Surface-Enhanced Raman Scattering
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Data
2011-02-01
Autores
Alessio, Priscila [UNESP]
De Saja Saez, J. A.
Aroca, Ricardo F. [UNESP]
Constantino, Carlos J. L. [UNESP]
Título da Revista
ISSN da Revista
Título de Volume
Editor
Soc Applied Spectroscopy
Resumo
Metal-organic semiconductor films are fabricated as co-evaporated films. It is demonstrated that the technique can be used to fabricate metal-semiconductor surface-enhanced Raman scattering (SERS) or surface-enhanced resonance Raman scattering (SERRS) substrates or to attain SERS or SERRS of highly insoluble pigments. The experiments are carried out using three different pigments: iron phthalocyanine (Fe Pc) and two substituted tetracaboxylic perylenes (PTCDs). The structure of the co-PVD films was characterized at the nanoscale by scanning electron microscopy through field-emission gun (SEM-FEG), revealing a fairly homogeneous spatial distribution of the silver-pigment nanoparticles. The fabricated mixed nanostructures show a homogenous distribution of plasmon enhancement as observed in the point-by-point mapping of the SERRS spectra recorded with micrometer spatial resolution in Raman microscopy.
Descrição
Palavras-chave
Surface-enhanced Raman scattering, SERS, Surface-enhanced resonance Raman scattering, SERRS, Evaporated film, Organic semiconductor, Phthalocyanine, Perylene
Como citar
Applied Spectroscopy. Frederick: Soc Applied Spectroscopy, v. 65, n. 2, p. 152-158, 2011.