Fatigue and retention properties of Bi3.25La0.75Ti3O12 films using LaNiO3 bottom electrodes
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Data
2009-05-01
Autores
Simões, Alexandre Zirpoli [UNESP]
Aguiar, E. C. [UNESP]
Riccardi, C. S. [UNESP]
Longo, Elson [UNESP]
Varela, José Arana [UNESP]
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Título de Volume
Editor
Elsevier B.V.
Resumo
Fatigue-free Bi3.25La0.75Ti3O12 (BLT) thin films were grown on LaNiO3 bottom electrodes grown in a microwave furnace at 700 degrees C for 10 min from the polymeric precursor method. It was found that LaNiO3 (LNO) bottom electrode with pseudocubic structure strongly promote the formation. of (001) texture of BLT films. The remanent polarization (P-r) and the drive voltage (V-c) were 11 mu C/cm(2) and 1.3 V respectively, and are better than the values found in the literature. The polarization of the Au/BLT/LNO/SiO2/Si (100) capacitors with a thickness of 280 nm exhibited no degradation after 1 x 1010 switching cycles at an applied voltage of 5 V with a frequency of 1 MHz. After several tests the capacitors retain 77% of its polarization upon a retention time of 10(4) s. (C) 2008 Elsevier B.V. All rights reserved.
Descrição
Palavras-chave
Thin films, Microwave furnace, Bottom electrode, Capacitor, Retention
Como citar
Materials Characterization. New York: Elsevier B.V., v. 60, n. 5, p. 353-356, 2009.