Influence of heat treatment on LiNbO3 thin films prepared on Si(111) by the polymeric precursor method
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Data
1999-07-01
Autores
Bouquet, V.
Longo, Elson [UNESP]
Leite, E. R.
Varela, José Arana [UNESP]
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Resumo
The effects of heat-treatment temperature on LiNbO3 thin films prepared by the polymeric precursor method were investigated. The precursor solution was deposited on Si(111) substrates by dip coating. X-ray diffraction and thermal analyses revealed that the crystallization process occurred at a low temperature (420 °C) and led to films with no preferential orientation. High-temperature treatments promoted formation of the LiNb3O8 phase. Scanning electron microscopy, coupled with energy dispersive spectroscopy analyses, showed that the treatment temperature also affected the film microstructure. The surface texture - homogeneous, smooth, and pore-free at low temperature - turned into an `islandlike' microstructure for high-temperature treatments.
Descrição
Palavras-chave
Crystal microstructure, Crystal orientation, Crystallization, Ferroelectric materials, Film preparation, Heat treatment, Lithium niobate, Piezoelectric materials, Silicon wafers, Surface structure, Thermal effects, Thin films, Polymeric precursor method, Dielectric films
Como citar
Journal of Materials Research, v. 14, n. 7, p. 3115-3121, 1999.