Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution

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dc.contributor.authorSimões, Alexandre Zirpoli [UNESP]
dc.contributor.authorRiccardi, C. S. [UNESP]
dc.contributor.institutionUniversidade Federal de Itajubá (UNIFEI)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T14:18:47Z
dc.date.available2014-05-20T14:18:47Z
dc.date.issued2009-01-01
dc.description.abstractSrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 mu C/cm(2) and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film. Copyright (C) 2009 A. Z. Simoes and C. S. Riccardi.en
dc.description.affiliationUniv Fed Itajuba Unifei, BR-3590037 Itabira, MG, Brazil
dc.description.affiliationUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14800900 Araraquara, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14800900 Araraquara, SP, Brazil
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.format.extent6
dc.identifierhttp://dx.doi.org/10.1155/2009/928545
dc.identifier.citationAdvances In Materials Science and Engineering. New York: Hindawi Publishing Corporation, p. 6, 2009.
dc.identifier.doi10.1155/2009/928545
dc.identifier.fileWOS000207891900001.pdf
dc.identifier.issn1687-6822
dc.identifier.urihttp://hdl.handle.net/11449/25672
dc.identifier.wosWOS:000207891900001
dc.language.isoeng
dc.publisherHindawi Publishing Corporation
dc.relation.ispartofAdvances In Materials Science and Engineering
dc.rights.accessRightsAcesso aberto
dc.sourceWeb of Science
dc.titleDielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solutionen
dc.typeArtigo
dcterms.licensehttp://www.hindawi.com/journals/apm/apc/
dcterms.rightsHolderHindawi Publishing Corporation
unesp.author.lattes0173401604473200[2]
unesp.author.orcid0000-0003-2192-5312[2]
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Química, Araraquarapt

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Artigos - Físico Química - IQ