Level crossing rate of Nakagami-m fading signal: Field trials and validation

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dc.contributor.authorYacoub, M. D.
dc.contributor.authorBarbin, M. V.
dc.contributor.authorde Castro, M. S.
dc.contributor.authorVargas, J. E.
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:30:01Z
dc.date.available2014-05-20T15:30:01Z
dc.date.issued2000-02-17
dc.description.abstractField trial measurements are used to validate the level crossing rate formula derived in an exact manner recently for the Nakagami-m signal. The formula reveals an excellent fit to measurements in situations other than those for which the Rice model is more appropriate.en
dc.description.affiliationUniv Estadual Campinas, Sch Elect & Comp Engn, BR-13083970 Campinas, SP, Brazil
dc.description.affiliationUNESP, Dept Elect Engn, Guaratingueta, SP, Brazil
dc.description.affiliationUnespUNESP, Dept Elect Engn, Guaratingueta, SP, Brazil
dc.format.extent355-357
dc.identifierhttp://dx.doi.org/10.1049/el:20000295
dc.identifier.citationElectronics Letters. Hertford: IEE-inst Elec Eng, v. 36, n. 4, p. 355-357, 2000.
dc.identifier.doi10.1049/el:20000295
dc.identifier.issn0013-5194
dc.identifier.urihttp://hdl.handle.net/11449/39479
dc.identifier.wosWOS:000085671500048
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofElectronics Letters
dc.relation.ispartofjcr1.232
dc.relation.ispartofsjr0,407
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleLevel crossing rate of Nakagami-m fading signal: Field trials and validationen
dc.typeArtigo
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIee-inst Elec Eng
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Engenharia, Guaratinguetápt

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Artigos - Engenharia Elétrica - FEG