Physical properties and reentrant behavior in PLZT thin films
| dc.contributor.author | Melo, M. [UNESP] | |
| dc.contributor.author | Araujo, E. B. [UNESP] | |
| dc.contributor.author | Neradovskaya, E. A. | |
| dc.contributor.author | Turygin, A. P. | |
| dc.contributor.author | Esin, A. A. | |
| dc.contributor.author | Shur, V. Ya | |
| dc.contributor.author | Kholkin, A. L. | |
| dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
| dc.contributor.institution | Ural Fed Univ | |
| dc.contributor.institution | Univ Aveiro | |
| dc.date.accessioned | 2018-11-26T17:31:23Z | |
| dc.date.available | 2018-11-26T17:31:23Z | |
| dc.date.issued | 2017-01-01 | |
| dc.description.abstract | La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films. | en |
| dc.description.affiliation | Sao Paulo State Univ, Dept Chem & Phys, Ilha Solteira, SP, Brazil | |
| dc.description.affiliation | Ural Fed Univ, Sch Nat Sci & Math, Ekaterinburg, Russia | |
| dc.description.affiliation | Univ Aveiro, Dept Phys, Aveiro, Portugal | |
| dc.description.affiliation | Univ Aveiro, CICECO Aveiro Inst Mat, Aveiro, Portugal | |
| dc.description.affiliationUnesp | Sao Paulo State Univ, Dept Chem & Phys, Ilha Solteira, SP, Brazil | |
| dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
| dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) | |
| dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
| dc.description.sponsorship | Russian Foundation for Basic Research | |
| dc.description.sponsorship | Government of the Russian Federation | |
| dc.description.sponsorship | FCT/MEC | |
| dc.description.sponsorship | FEDER | |
| dc.description.sponsorshipId | CNPq: 304604/2015-1 | |
| dc.description.sponsorshipId | CNPq: 400677/2014-8 | |
| dc.description.sponsorshipId | CNPq: 232241/2014-7 | |
| dc.description.sponsorshipId | Russian Foundation for Basic Research: 16-02-00821-a | |
| dc.description.sponsorshipId | Government of the Russian Federation: 02.A03.21.0006 | |
| dc.description.sponsorshipId | FCT/MEC: FCT UID/CTM/50011/2013 | |
| dc.format.extent | 1-9 | |
| dc.identifier | http://dx.doi.org/10.1080/00150193.2017.1289792 | |
| dc.identifier.citation | Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 509, n. 1, p. 1-9, 2017. | |
| dc.identifier.doi | 10.1080/00150193.2017.1289792 | |
| dc.identifier.file | ||
| dc.identifier.file | WOS000401196300001.pdf | |
| dc.identifier.file | ||
| dc.identifier.issn | 0015-0193 | |
| dc.identifier.uri | http://hdl.handle.net/11449/162787 | |
| dc.identifier.wos | WOS:000401196300001 | |
| dc.language.iso | eng | |
| dc.publisher | Taylor & Francis Ltd | |
| dc.relation.ispartof | Ferroelectrics | |
| dc.relation.ispartofsjr | 0,260 | |
| dc.rights.accessRights | Acesso aberto | |
| dc.source | Web of Science | |
| dc.subject | PLZT | |
| dc.subject | thin films | |
| dc.subject | relaxors | |
| dc.subject | dipole glass | |
| dc.title | Physical properties and reentrant behavior in PLZT thin films | en |
| dc.type | Artigo | |
| dcterms.license | http://journalauthors.tandf.co.uk/permissions/reusingOwnWork.asp | |
| dcterms.rightsHolder | Taylor & Francis Ltd | |
| dspace.entity.type | Publication | |
| unesp.department | Física e Química - FEIS | pt |
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