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Simple method for detection of the self-heating signature

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dc.contributor.authorMori, C. A.B.
dc.contributor.authorAgopian, P. G.D. [UNESP]
dc.contributor.authorMartino, J. A.
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2018-12-11T16:51:17Z
dc.date.available2018-12-11T16:51:17Z
dc.date.issued2017-11-15
dc.description.abstractThis paper reports a simple method for detection of the self-heating effect through a special signature, without the need of specific structures or high frequency systems, even in devices presenting positive output conductances. In order to develop this method, simple numerical models were employed, and later verified through experimental observation with pFinFET devices.en
dc.description.affiliationLSI/PSI/USP University of Sao Paulo
dc.description.affiliationSao Paulo State University (UNESP)
dc.description.affiliationUnespSao Paulo State University (UNESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.identifierhttp://dx.doi.org/10.1109/SBMicro.2017.8112974
dc.identifier.citationSBMicro 2017 - 32nd Symposium on Microelectronics Technology and Devices: Chip on the Sands, co-located Symposia: 30th SBCCI - Circuits and Systems Design, 2nd INSCIT - Electronic Instrumentation, 7th WCAS - IC Design Cases and 17th SForum - Undergraduate-Student Forum.
dc.identifier.doi10.1109/SBMicro.2017.8112974
dc.identifier.lattes0496909595465696
dc.identifier.orcid0000-0002-0886-7798
dc.identifier.scopus2-s2.0-85040577396
dc.identifier.urihttp://hdl.handle.net/11449/170553
dc.language.isoeng
dc.relation.ispartofSBMicro 2017 - 32nd Symposium on Microelectronics Technology and Devices: Chip on the Sands, co-located Symposia: 30th SBCCI - Circuits and Systems Design, 2nd INSCIT - Electronic Instrumentation, 7th WCAS - IC Design Cases and 17th SForum - Undergraduate-Student Forum
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectFinFET
dc.subjectSelf-heating effect
dc.subjectSemiconductor-On-Insulator
dc.titleSimple method for detection of the self-heating signatureen
dc.typeTrabalho apresentado em evento
dspace.entity.typePublication
unesp.author.lattes0496909595465696[2]
unesp.author.orcid0000-0002-0886-7798[2]

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