High temperature X-ray diffraction study of the U4O9 formation on UO2 sintered plates
Loading...
Files
External sources
External sources
Date
Advisor
Coadvisor
Graduate program
Undergraduate course
Journal Title
Journal ISSN
Volume Title
Publisher
Type
Article
Access right
Acesso restrito
Files
External sources
External sources
Abstract
The surface oxidation of UO2 sintered plates at 170-275 ° C was studied in situ by high temperature X-ray diffractometry. At very low oxygen concentration, UO2 is oxidized to U4O9, while at 300°C and argon-20 vol% oxygen it is oxidized up to U3O7. X-ray diffraction profiles of the UO2, U4O9 and U3O7 phases were well characterized during the transformations. The activation energy for the transformation of UO2 to U4O9, obtained from X-ray diffraction data, was found to be 117 ± 9 kJ/mol and 90 ± 14 kJ/mol for the β-(311) and α-(200) reflections, respectively. © 1991.
Description
Keywords
Chemical Reactions--Radiation Effects, X-rays--Diffraction, Activation Energy, Sintered Plates, Uranium Dioxide
Language
English
Citation
Journal of Nuclear Materials, v. 178, n. 1, p. 33-39, 1991.
