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Damage Characterization Using Guided-Wave Linear Arrays and Image Compounding Techniques

dc.contributor.authorHiguti, Ricardo T. [UNESP]
dc.contributor.authorMartinez-Graullera, Oscar
dc.contributor.authorMartin, Carlos J.
dc.contributor.authorOctavio, Alberto
dc.contributor.authorElvira, Luis
dc.contributor.authorMontero de Espinosa, Francisco
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionConsejo Super Invest Cientif
dc.date.accessioned2014-05-20T15:30:24Z
dc.date.available2014-05-20T15:30:24Z
dc.date.issued2010-09-01
dc.description.abstractIn this work, a high-resolution imaging method for the inspection of isotropic plate-like structures using linear arrays and Lamb waves is proposed. The evaluation of these components is limited by the low dynamic range resulting from main lobe and side lobe field patterns, and from the narrow-band nature of the Lamb waves. Based on a full matrix array, synthetic aperture technique using all emitter-receiver combinations, different images from the same object are obtained by using different apodization coefficients, which are related to a trade-off between main lobe width and relative side lobe level. Several image compounding strategies have been tested and a new algorithm, based on apodization and polarity diversities between signals, is proposed. However, some effects, such as the dead zone close to the array and reverberations caused by interactions of the wavefront and defects, still limit the quality of the images. The use of spatial diversity, obtained by an additional array, introduces complementary information about the defects and improves the results of the proposed algorithm, producing high-resolution, high-contrast images. Experimental results are shown for a 1-mm-thick isotropic aluminum plate with artificial defects using linear arrays formed by 30 piezoelectric elements, with the low dispersion symmetric mode S0 at the frequency of 330 kHz.en
dc.description.affiliationUniv Estadual Paulista, Dept Elect Engn, São Paulo, Brazil
dc.description.affiliationConsejo Super Invest Cientif, CAEND UPM CSIC, Ctr Acust Aplicada Evaluac Destruct, Madrid, Spain
dc.description.affiliationUnespUniv Estadual Paulista, Dept Elect Engn, São Paulo, Brazil
dc.description.sponsorshipSpanish Ministry of Science and Innovation
dc.description.sponsorshipEuropean Regional Development Fund (ERDF)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.description.sponsorshipIdSpanish MICINN: DPI2007- 65408-C02-01
dc.description.sponsorshipIdSpanish MICINN: DPI2007-65408-C02-02
dc.description.sponsorshipIdSpanish MICINN: PSE-020000-2009-10
dc.description.sponsorshipIdSpanish MICINN: PSS-020000-2009-25
dc.description.sponsorshipIdCAPES: 3711-08-0
dc.format.extent1985-1995
dc.identifierhttp://dx.doi.org/10.1109/TUFFC.2010.1646
dc.identifier.citationIEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control. Piscataway: IEEE-Inst Electrical Electronics Engineers Inc, v. 57, n. 9, p. 1985-1995, 2010.
dc.identifier.doi10.1109/TUFFC.2010.1646
dc.identifier.issn0885-3010
dc.identifier.lattes6405339510883203
dc.identifier.orcid0000-0003-4201-5617
dc.identifier.urihttp://hdl.handle.net/11449/39790
dc.identifier.wosWOS:000283359700010
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofIEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control
dc.relation.ispartofjcr2.704
dc.relation.ispartofsjr1,183
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleDamage Characterization Using Guided-Wave Linear Arrays and Image Compounding Techniquesen
dc.typeArtigo
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIEEE-Inst Electrical Electronics Engineers Inc
dspace.entity.typePublication
unesp.author.lattes6405339510883203[1]
unesp.author.orcid0000-0003-4201-5617[1]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Ilha Solteirapt
unesp.departmentEngenharia Elétrica - FEISpt

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