Publicação: The use of elevation map histograms for topographic heterogeneity analysis
Nenhuma Miniatura disponível
Data
2013-07-01
Orientador
Coorientador
Pós-graduação
Curso de graduação
Título da Revista
ISSN da Revista
Título de Volume
Editor
Tipo
Artigo
Direito de acesso
Acesso restrito
Resumo
Surface defects are extremely important in mechanical characterization of several different materials. Therefore, the analysis of surface finishing is essential for a further simulation of surface mechanical properties in a customized project in materials science and technology. One of the methods commonly employed for such purpose is the statistical mapping of different sample surface regions using the depth from focus technique. The analysis is usually performed directly from the elevation maps which are obtained from the digital image processing. In this paper, the possibility of quantifying the surface heterogeneity of Silicon Carbide porous ceramics by elevation map histograms is presented. The advantage of this technique is that it allows the qualitative or quantitative verification of all surface image fields that cannot be done by using the Surface Plot plugin of image J™ platform commonly used in digital image processing. © 2012 Springer Science+Business Media, LLC.
Descrição
Palavras-chave
Depth from focus, Elevation map, Histogram, Surface, Elevation maps, Materials science and technology, Mechanical characterizations, Quantitative verification, Surface heterogeneities, Surface mechanical properties, Characterization, Graphic methods, Image processing, Mechanical properties, Silicon carbide, Statistical methods, Surfaces
Idioma
Inglês
Como citar
Journal of Superconductivity and Novel Magnetism, v. 26, n. 7, p. 2529-2531, 2013.
