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Controlled fluorination of a-C:F:H films by PECVD of ethylene-hexafluorobenzene mixtures

dc.contributor.authorLopes, Bruno Bellotti [UNESP]
dc.contributor.authorDavanzo, Celso U.
dc.contributor.authorSchreiner, Wido
dc.contributor.authorDurrant, Steven F. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.contributor.institutionUniversidade Federal do Paraná (UFPR)
dc.date.accessioned2014-05-20T15:30:52Z
dc.date.available2014-05-20T15:30:52Z
dc.date.issued2008-12-25
dc.description.abstractHighly fluorinated plasma polymers are chemically inert,acid resistant and have low friction coefficients, thereby being useful in chemical laboratories and for tribological applications. Here we report the plasma polymerization of ethylene-hexafluorobenzene mixtures by PECVD. The principal parameter of interest is the proportion of C(6)F(6) in the feed, R(F). Films were analyzed using near-normal and grazing-angle Infrared Reflection Absorption Spectroscopy (IRRAS), the latter being particularly useful for detecting modes not usually observed at near-normal incidence. The presence of CH and CF(x) (x=1 to 2) groups was thus confirmed in films deposited with R(F)>= 40%. Depending on R(F) IRRAS also revealed the presence of -CH(x) (x=1 to 3) -C=C, -C=O and phenyl rings. Deconvolution of C is spectra obtained by X-ray Photoelectron Spectroscopy (XPS) confirmed the presence of CH, CF and CF(2) groups in films deposited with R(F)>= 40%. Atomic ratios of F:C calculated from the XPS spectral data show that the degree of fluorination rises with increasing RF Some unbound fluorine is present in the films. Post-deposition reactions account for the presence of oxygen (similar to 5%) in the films. Surface energies, determined from contact angle measurements, fall with increasing R(F). (C) 2008 Elsevier B.V. All rights reserved.en
dc.description.affiliationUniv Estadual Paulista, Lab Plasmas Tecnol, BR-18087180 Sorocaba, SP, Brazil
dc.description.affiliationUniv Estadual Campinas, Inst Quim, BR-13083970 Campinas, SP, Brazil
dc.description.affiliationUniversidade Federal do Paraná (UFPR), BR-80060000 Curitiba, Parana, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Lab Plasmas Tecnol, BR-18087180 Sorocaba, SP, Brazil
dc.format.extent526-529
dc.identifierhttp://dx.doi.org/10.1016/j.surfcoat.2008.08.032
dc.identifier.citationSurface & Coatings Technology. Lausanne: Elsevier B.V. Sa, v. 203, n. 5-7, p. 526-529, 2008.
dc.identifier.doi10.1016/j.surfcoat.2008.08.032
dc.identifier.issn0257-8972
dc.identifier.orcid0000-0002-4511-3768
dc.identifier.urihttp://hdl.handle.net/11449/40165
dc.identifier.wosWOS:000261654100026
dc.language.isoeng
dc.publisherElsevier B.V. Sa
dc.relation.ispartofSurface & Coatings Technology
dc.relation.ispartofjcr2.906
dc.relation.ispartofsjr0,928
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectPECVDen
dc.subjectHexafluorobenzeneen
dc.subjectThin filmsen
dc.subjectXPSen
dc.subjectIRRASen
dc.titleControlled fluorination of a-C:F:H films by PECVD of ethylene-hexafluorobenzene mixturesen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderElsevier B.V. Sa
dspace.entity.typePublication
unesp.author.orcid0000-0002-4511-3768[4]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Ciência e Tecnologia, Sorocabapt
unesp.departmentEngenharia de Controle e Automação - ICTSpt

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