Publicação: Electrical behavior analysis of n-type CaCu3Ti4O12 thick films exposed to different atmospheres
| dc.contributor.author | Ponce, M. A. | |
| dc.contributor.author | Ramirez Gil, Miguel Angel [UNESP] | |
| dc.contributor.author | Schipani, F. | |
| dc.contributor.author | Joanni, E. | |
| dc.contributor.author | Tomba, J. P. | |
| dc.contributor.author | Castro, M. S. | |
| dc.contributor.institution | Univ Mar del Plata UNMdP | |
| dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
| dc.contributor.institution | CTI Renato Archer | |
| dc.date.accessioned | 2015-03-18T15:53:34Z | |
| dc.date.available | 2015-03-18T15:53:34Z | |
| dc.date.issued | 2015-01-01 | |
| dc.description.abstract | In this work n-type CaCu3Ti4O12 (CCTO) thick films obtained by screen printing were studied. The role of the potential barrier characteristics (height and width) was considered in order to explain the electrical behavior. The electrical response was also analyzed considering the oxygen adsorption and subsequent diffusion into the grains at temperatures higher than 280 degrees C. Tunnel currents were also calculated taking into account the donor concentration values for films in vacuum atmosphere. Published by Elsevier Ltd. | en |
| dc.description.affiliation | Univ Mar del Plata UNMdP, Natl Res Council CONICET, Inst Mat Sci & Technol INTEMA, Mar Del Plata, Buenos Aires, Argentina | |
| dc.description.affiliation | Univ Estadual Paulista, UNESP, Fac Engn Guaratingueta, BR-12516410 Guaratingueta, SP, Brazil | |
| dc.description.affiliation | CTI Renato Archer, BR-13069901 Campinas, SP, Brazil | |
| dc.description.affiliationUnesp | Univ Estadual Paulista, UNESP, Fac Engn Guaratingueta, BR-12516410 Guaratingueta, SP, Brazil | |
| dc.description.sponsorship | ANPCyT (Agencia Nacional de Promocion Cientifica y Tecnologica, Argentina) | |
| dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
| dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) | |
| dc.format.extent | 153-161 | |
| dc.identifier | http://dx.doi.org/10.1016/j.jeurceramsoc.2014.08.041 | |
| dc.identifier.citation | Journal Of The European Ceramic Society. Oxford: Elsevier Sci Ltd, v. 35, n. 1, p. 153-161, 2015. | |
| dc.identifier.doi | 10.1016/j.jeurceramsoc.2014.08.041 | |
| dc.identifier.issn | 0955-2219 | |
| dc.identifier.lattes | 0510519968514907 | |
| dc.identifier.uri | http://hdl.handle.net/11449/116600 | |
| dc.identifier.wos | WOS:000344123700017 | |
| dc.language.iso | eng | |
| dc.publisher | Elsevier B.V. | |
| dc.relation.ispartof | Journal Of The European Ceramic Society | |
| dc.relation.ispartofjcr | 3.794 | |
| dc.relation.ispartofsjr | 1,068 | |
| dc.rights.accessRights | Acesso restrito | |
| dc.source | Web of Science | |
| dc.subject | Semiconductor | en |
| dc.subject | Conduction mechanism | en |
| dc.subject | CaCu3Ti4O12 | en |
| dc.subject | Diffusion | en |
| dc.title | Electrical behavior analysis of n-type CaCu3Ti4O12 thick films exposed to different atmospheres | en |
| dc.type | Artigo | |
| dcterms.license | http://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy | |
| dcterms.rightsHolder | Elsevier B.V. | |
| dspace.entity.type | Publication | |
| unesp.author.lattes | 0510519968514907 | |
| unesp.campus | Universidade Estadual Paulista (UNESP), Faculdade de Engenharia, Guaratinguetá | pt |
| unesp.department | Materiais e Tecnologia - FEG | pt |