Publicação: DC method for self-heating estimation applied to FinFET
| dc.contributor.author | Mori, C. A. B. | |
| dc.contributor.author | Agopian, P. G. D. [UNESP] | |
| dc.contributor.author | Martino, J. A. | |
| dc.contributor.author | IEEE | |
| dc.contributor.institution | Universidade de São Paulo (USP) | |
| dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
| dc.date.accessioned | 2019-10-03T18:20:11Z | |
| dc.date.available | 2019-10-03T18:20:11Z | |
| dc.date.issued | 2018-01-01 | |
| dc.description.abstract | This paper reports an extension on the application of the DC method for the estimation of self-heating effects from planar to FinFET devices, verified through theoretical considerations and numerical simulations. In the worst case, a difference of 5.6% was observed on the estimation of the transistors channel temperature when compared to a traditional method. | en |
| dc.description.affiliation | Univ Sao Paulo, PSI, LSI, Sao Paulo, Brazil | |
| dc.description.affiliation | Sao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, Brazil | |
| dc.description.affiliationUnesp | Sao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, Brazil | |
| dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
| dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
| dc.format.extent | 4 | |
| dc.identifier.citation | 2018 33rd Symposium On Microelectronics Technology And Devices (sbmicro). New York: Ieee, 4 p., 2018. | |
| dc.identifier.lattes | 0496909595465696 | |
| dc.identifier.orcid | 0000-0002-0886-7798 | |
| dc.identifier.uri | http://hdl.handle.net/11449/184140 | |
| dc.identifier.wos | WOS:000451195800042 | |
| dc.language.iso | eng | |
| dc.publisher | Ieee | |
| dc.relation.ispartof | 2018 33rd Symposium On Microelectronics Technology And Devices (sbmicro) | |
| dc.rights.accessRights | Acesso aberto | pt |
| dc.source | Web of Science | |
| dc.subject | Self-heating effect | |
| dc.subject | FinFET | |
| dc.subject | Semi conductor-On-Insulator | |
| dc.title | DC method for self-heating estimation applied to FinFET | en |
| dc.type | Trabalho apresentado em evento | pt |
| dcterms.license | http://www.ieee.org/publications_standards/publications/rights/rights_policies.html | |
| dcterms.rightsHolder | Ieee | |
| dspace.entity.type | Publication | |
| unesp.author.lattes | 0496909595465696[2] | |
| unesp.author.orcid | 0000-0002-0886-7798[2] | |
| unesp.campus | Universidade Estadual Paulista (UNESP), Faculdade de Engenharia, São João da Boa Vista | pt |