Optical characterization of cubic AlGaN/GaN quantum wells
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Wiley-Blackwell
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Article
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Abstract
Cubic phase group III-nitrides were grown using RF plasma assisted Molecular Beam Epitaxy on GaAs (001) substrates. High-resolution X-ray diffraction, photoluminescence, cathodoluminescence and photoreflectance measurements were employed to characterize the structural and optical properties of GaN/AlxGa1-xN Multi Quantum Well (MQW) structures, in which both Aluminum content and well widths were varied. The observed quantized states are in agreement with first-principles based theoretical calculations.
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English
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Physica Status Solidi A-applied Research. Weinheim: Wiley-v C H Verlag Gmbh, v. 192, n. 1, p. 129-134, 2002.



