Level crossing rate of Nakagami-m fading signal: Field trials and validation
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Undergraduate course
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Institute of Electrical and Electronics Engineers (IEEE)
Institution of Engineering and Technology (IET)
Institution of Engineering and Technology (IET)
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Article
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Abstract
Field trial measurements are used to validate the level crossing rate formula derived in an exact manner recently for the Nakagami-m signal. The formula reveals an excellent fit to measurements in situations other than those for which the Rice model is more appropriate.
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English
Citation
Electronics Letters. Hertford: IEE-inst Elec Eng, v. 36, n. 4, p. 355-357, 2000.
