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Structural depth profile and nanoscale piezoelectric properties of randomly oriented Pb(Zr0.50Ti0.50)O-3 thin films

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dc.contributor.authorLima, E. C. [UNESP]
dc.contributor.authorAraujo, E. B. [UNESP]
dc.contributor.authorSouza Filho, A. G.
dc.contributor.authorPaschoal, A. R.
dc.contributor.authorBdikin, I. K.
dc.contributor.authorKholkin, A. L.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade Federal do Ceará (UFC)
dc.contributor.institutionUniv Aveiro
dc.date.accessioned2014-05-20T13:29:46Z
dc.date.available2014-05-20T13:29:46Z
dc.date.issued2012-05-30
dc.description.abstractThe structural properties of Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation were studied throughout the film thickness. An analysis on depth profile shows the existence of a significant (1 0 0) alignment near the film-electrode interface. Nanoscale piezoelectric measurements demonstrate the existence of a self-polarization effect in the studied films. An increase in this effect with film thickness increasing from 200 to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-electrode interface cannot be the main mechanisms responsible for the self-polarization effect in the studied films.en
dc.description.affiliationUNESP Univ Estadual Paulista, Dept Fis & Quim, Fac Engn Ilha Solteira, BR-15385000 Ilha Solteira, SP, Brazil
dc.description.affiliationUniversidade Federal do Ceará (UFC), Dept Fis, BR-60455900 Fortaleza, Ceara, Brazil
dc.description.affiliationUniv Aveiro, Dept Mech Engn, P-3810193 Aveiro, Portugal
dc.description.affiliationUniv Aveiro, TEMA, P-3810193 Aveiro, Portugal
dc.description.affiliationUniv Aveiro, Dept Mat & Ceram Engn, P-3810193 Aveiro, Portugal
dc.description.affiliationUniv Aveiro, CICECO, P-3810193 Aveiro, Portugal
dc.description.affiliationUnespUNESP Univ Estadual Paulista, Dept Fis & Quim, Fac Engn Ilha Solteira, BR-15385000 Ilha Solteira, SP, Brazil
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipIdFAPESP: 07/08534-3
dc.description.sponsorshipIdFAPESP: 10/16504-0
dc.description.sponsorshipIdCNPq: 307607/2009-7
dc.format.extent6
dc.identifierhttp://dx.doi.org/10.1088/0022-3727/45/21/215304
dc.identifier.citationJournal of Physics D-applied Physics. Bristol: Iop Publishing Ltd, v. 45, n. 21, p. 6, 2012.
dc.identifier.doi10.1088/0022-3727/45/21/215304
dc.identifier.issn0022-3727
dc.identifier.lattes6725982228402054
dc.identifier.urihttp://hdl.handle.net/11449/10070
dc.identifier.wosWOS:000304056100011
dc.language.isoeng
dc.publisherIop Publishing Ltd
dc.relation.ispartofJournal of Physics D: Applied Physics
dc.relation.ispartofjcr2.373
dc.relation.ispartofsjr0,717
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleStructural depth profile and nanoscale piezoelectric properties of randomly oriented Pb(Zr0.50Ti0.50)O-3 thin filmsen
dc.typeArtigo
dcterms.licensehttp://iopscience.iop.org/page/copyright
dcterms.rightsHolderIop Publishing Ltd
dspace.entity.typePublication
unesp.author.lattes6725982228402054
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Ilha Solteirapt
unesp.departmentFísica e Química - FEISpt

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Ilha Solteira - FEIS - Faculdade de Engenharia