Dielectric investigations in Sr0.75Ba0.25Nb2O6 relaxor ferroelectric thin films
Nenhuma Miniatura disponível
Data
2009-06-01
Autores
Santos, I. A.
Mendes, R. G.
Eiras, J. A.
Guerra, J. de Los S.
Araujo, E. B. [UNESP]
Título da Revista
ISSN da Revista
Título de Volume
Editor
Springer
Resumo
The dielectric properties of Sr0.75Ba0.25Nb2O6 relaxor ferroelectric thin films were carefully analyzed. In contrast to bulk samples which present three distinct dielectric relaxation phenomena Sr0.75Ba0.25Nb2O6 thin films present only two of them. The suppression of the third anomaly can be mainly attributed to the narrow grain size distribution of nanograins and weak tensile strains imposed to the film from the substrate. The whole set of results point to the interpretation of a dielectric response characteristic of mesoscopic structure, which is composed of clusters and nanodomains.
Descrição
Palavras-chave
Como citar
Applied Physics A-materials Science & Processing. New York: Springer, v. 95, n. 3, p. 757-760, 2009.