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dc.contributor.authorBarbosa, Eduardo A. [UNESP]
dc.contributor.authorPreto, André O. [UNESP]
dc.date.accessioned2014-05-27T11:23:33Z
dc.date.available2014-05-27T11:23:33Z
dc.date.issued2008-05-21
dc.identifierhttp://dx.doi.org/10.1063/1.2926872
dc.identifier.citationAIP Conference Proceedings, v. 992, p. 285-290.
dc.identifier.issn0094-243X
dc.identifier.issn1551-7616
dc.identifier.urihttp://hdl.handle.net/11449/130463
dc.description.abstractRefractive and profilometric measurements of lenses were performed through holography with a photorefractive Bi12TiO20 crystal as the recording medium. Two properly aligned diode lasers emitting in the red region were employed as light sources. Both lasers were tuned in order to provide millimetric and sub-millimetric synthetic wavelengths. The surfaces of the test lens were covered by a 25-μm opaque plastic tape in order to allow the lens profilometry upon illuminating them with a collimated beam. The resulting holographic images appear covered by interference fringes corresponding to the wavefront geometry of the wave scattered by the lens. For refractive index measurement a diffusely scattering flat surface was positioned behind the uncovered lens which was also illuminated by a plane wave. The resulting contour interferogram describes the form of the wavefront after the beam traveled back and forth through the lens. The fringe quantitative evaluation was carried out through the four-stepping technique and the resulting phase map and the Branch-cut method was employed for phase unwrapping. The only non-optical procedure for lens characterization was the thickness measurement, made by a dial caliper. Exact ray tracing calculation was performed in order to establish a relation between the output wavefront geometry and the lens parameters like radii of curvature, thickness and refractive index. By quantitatively comparing the theoretical wavefront geometry with the experimental results relative uncertainties bellow 3% for refractive index and 1 % for focal length were obtained. © 2008 American Institute of Physics.en
dc.format.extent285-290
dc.language.isoeng
dc.publisherAmerican Institute of Physics (AIP)
dc.relation.ispartofAIP Conference Proceedings
dc.sourceScopus
dc.titleLensometry by two-laser holography with photorefractive Bi12TiO20en
dc.typeArtigo
dcterms.licensehttp://publishing.aip.org/authors/web-posting-guidelines
dcterms.rightsHolderAmer Inst Physics
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.description.affiliationLaboratório de Óptica Aplicada Faculdade de Tecnologia de São Paulo CEETEPS-UNESP, Pça Cel Fernando Prestes, 30, CEP 01124 060, São Paulo - SP
dc.description.affiliationUnespLaboratório de Óptica Aplicada Faculdade de Tecnologia de São Paulo CEETEPS-UNESP, Pça Cel Fernando Prestes, 30, CEP 01124 060, São Paulo - SP
dc.identifier.doi10.1063/1.2926872
dc.identifier.wosWOS:000255857900048
dc.rights.accessRightsAcesso restrito
dc.identifier.scopus2-s2.0-43649098902
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