Show simple item record

dc.contributor.authorAstorga, Oscar Armando Maldonado [UNESP]
dc.contributor.authordo Prado, Afonso Jose [UNESP]
dc.date.accessioned2014-05-27T11:17:58Z
dc.date.available2014-05-27T11:17:58Z
dc.date.issued1994-12-01
dc.identifierhttp://dx.doi.org/10.1109/ELINSL.1994.401397
dc.identifier.citationConference Record of IEEE International Symposium on Electrical Insulation, p. 546-549.
dc.identifier.issn0164-2006
dc.identifier.urihttp://hdl.handle.net/11449/130721
dc.description.abstractResults of the analysis of dynamic behavior of flashover phenomenon on the high voltage-polluted insulators are presented. These results were taken from a mathematical and an experimental model that introduce the variable thickness influence of the layer pollution deposited on the high-voltage insulator surface. Analysis of the flashover was done by way of introducing a variation in the thickness of the channel of Obenaus' model, simulating a layer pollution of variable thickness. The objective was to obtain a better reproduction of the real layer pollution deposited on the insulator that works in the polluted regions. Two types of thickness variations were used: a sudden variation, using a step; and a soft variation, using a ramp; that were put along the way of the discharge. Comparison between the mathematical and experimental models showed that introduction of a ramp makes Obenaus' model more efficient in analyzing behavior of flashover phenomenon.en
dc.format.extent546-549
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofConference Record of IEEE International Symposium on Electrical Insulation
dc.sourceScopus
dc.subjectAlgorithms
dc.subjectComputer simulation
dc.subjectElectric discharges
dc.subjectEquivalent circuits
dc.subjectGeometry
dc.subjectMathematical models
dc.subjectFlashover phenomenon
dc.subjectHigh voltage polluted insulators
dc.subjectObenaus model
dc.subjectRamp
dc.subjectStep
dc.subjectVoltage polarity
dc.subjectElectric insulators
dc.titleFlashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulatorsen
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderI E E E
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.description.affiliationUNESP,FEIS,DEPT ENGN ELETR,BR-15378000 ILHA SOLTEIRA,SP,BRAZIL
dc.description.affiliationUnespUNESP,FEIS,DEPT ENGN ELETR,BR-15378000 ILHA SOLTEIRA,SP,BRAZIL
dc.identifier.doi10.1109/ELINSL.1994.401397
dc.identifier.wosWOS:A1994BA96P00132
dc.rights.accessRightsAcesso aberto
dc.identifier.scopus2-s2.0-0028564615
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Ilha Solteirapt
Localize o texto completo

Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record