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dc.contributor.authorBastos, W. B.
dc.contributor.authorLongo, E.
dc.contributor.authorChiquito, A. J.
dc.contributor.authorPontes, D. S. L. [UNESP]
dc.contributor.authorPontes, F. M. [UNESP]
dc.date.accessioned2018-11-26T17:54:16Z
dc.date.available2018-11-26T17:54:16Z
dc.date.issued2018-08-01
dc.identifierhttp://dx.doi.org/10.1016/j.matchemphys.2018.04.062
dc.identifier.citationMaterials Chemistry And Physics. Lausanne: Elsevier Science Sa, v. 214, p. 180-184, 2018.
dc.identifier.issn0254-0584
dc.identifier.urihttp://hdl.handle.net/11449/164368
dc.description.abstractIn this study, undoped-(Pb,Sr)TiO3 and Fe3+, La3+ co-doped (Pb,Sr)TiO3 thin films were investigated at the nanoscale level by piezoresponse force microscopy (PFM), in order to evaluate the impact of doping induced damages on the ferroelectric and piezoelectric properties. Detailed investigations with nano scale resolution have revealed occurrence of abnormal domains in writing pattern under forward and reverse bias for (Pb,Sr,La)(Ti,Fe)O-3 thin films. Further piezoresponse hysteresis loop measurements show that fully switchable loops were observed under high voltage mediated by defect dipoles and by ferroelectric-like polar defects clusters. They have been discussed taking into account charged defect formation with both local changes in the dipole moment and local symmetry breaking effects. In addition, the domain writing and its retention behavior of the undoped-PST and (Pb,Sr,La)(Ti,Fe)O-3 thin films were investigated. Undoped-PST films exhibited better stability for both positive and negative domains for a relatively long time in comparison to that observed for (Pb,Sr,La)(Ti,Fe)O-3 films. (C) 2018 Elsevier B.V. All rights reserved.en
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.format.extent180-184
dc.language.isoeng
dc.publisherElsevier B.V.
dc.relation.ispartofMaterials Chemistry And Physics
dc.sourceWeb of Science
dc.subjectPoint defects
dc.subjectThin films
dc.subjectPiezoresponse force microscopy
dc.subjectPiezoelectric behavior
dc.titleInvestigation of defects dependence of local piezoelectric response on Fe, La-modified (Pb,Sr)TiO3 thin films: A piezoresponse force microscopy studyen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderElsevier B.V.
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.description.affiliationUniv Fed Sao Carlos, Dept Chem, LIEC, Via Washington Luiz,Km 235,POB 676, BR-13565905 Sao Carlos, SP, Brazil
dc.description.affiliationUniv Fed Sao Carlos, Dept Phys, NanO LaB, Via Washington Luiz,Km 235,POB 676, BR-13565905 Sao Carlos, SP, Brazil
dc.description.affiliationUniv Estadual Paulista Unesp, Dept Chem, POB 473, BR-17033360 Bauru, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista Unesp, Dept Chem, POB 473, BR-17033360 Bauru, SP, Brazil
dc.identifier.doi10.1016/j.matchemphys.2018.04.062
dc.identifier.wosWOS:000437068400022
dc.rights.accessRightsAcesso aberto
dc.description.sponsorshipIdFAPESP: 11/20536-7
dc.description.sponsorshipIdFAPESP: 12/14106-2
dc.description.sponsorshipIdFAPESP: 13/07296-2
dc.description.sponsorshipIdFAPESP: 17/10819-8
dc.identifier.fileWOS000437068400022.pdf
dc.relation.ispartofsjr0,615
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