No dia 25 de Setembro de 2023, faremos a migração do Repositório Institucional para a versão 7.6 do sistema DSpace. Por este motivo, o Repositório Institucional ficará indisponível neste dia. Contamos com a compreensão de todos.
The paper discusses methods for the measurement of the electron emission currents and the secondary electron yield for electron-irradiated dielectrics. Here the surface of the irradiated dielectric acts as both a collector and a measuring electrode, while a separate collector for recording the emitted electrons is discarded. Secondary yields for a series of dielectrics are represented in the form of a ‘universal’ curve. © 1991 IEEE