Now showing items 1-2 of 2
Piezoresponse force microscopy characterization of rare-earth doped BiFeO3 thin films grown by the soft chemical method
(Ceramics International, 2013-04-01) [Resenha]
The multiferroic behavior with ion modification using rare-earth cations on crystal structures, along with the insulating properties of BiFeO3 (BFO) thin films was investigated using piezoresponse force microscopy. ...
Rietveld analyses and piezoelectric properties of niobium doped bismuth titanate systems
(Journal of Advanced Microscopy Research, 2010-08-01) [Resenha]
Bi 4Ti 3- xNbxO 12 (BITNb) samples, with × ranging from 0 to 0.40 were obtained using a polymeric precursor solution. Rietveld analyses confirmed that the powders crystallize in an orthorhombic structure free of secondary ...