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dc.contributor.authorCosta, AFB
dc.date.accessioned2014-05-20T15:20:16Z
dc.date.available2014-05-20T15:20:16Z
dc.date.issued1999-10-01
dc.identifierhttp://asq.org/qic/display-item/?item=13851
dc.identifier.citationJournal of Quality Technology. Milwaukee: Amer Soc Quality Control-asqc, v. 31, n. 4, p. 387-397, 1999.
dc.identifier.issn0022-4065
dc.identifier.urihttp://hdl.handle.net/11449/31595
dc.description.abstractRecent studies have shown that the (X) over bar chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional (X) over bar chart. This article extends these studies for processes that are monitored by both the (X) over bar and R charts. A Markov chain model is used to determine the properties of the joint (X) over bar and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint (X) over bar and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.en
dc.format.extent387-397
dc.language.isoeng
dc.publisherAmer Soc Quality Control-asqc
dc.relation.ispartofJournal of Quality Technology
dc.sourceWeb of Science
dc.titleJoint (X)over-bar and R charts with variable sample sizes and sampling intervalsen
dc.typeArtigo
dcterms.licensehttp://asq.org/copyright/
dcterms.rightsHolderAmer Soc Quality Control-asqc
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.description.affiliationSão Paulo State Univ, UNESP, Dept Prod, BR-12500000 Guaratingueta, Brazil
dc.description.affiliationUnespSão Paulo State Univ, UNESP, Dept Prod, BR-12500000 Guaratingueta, Brazil
dc.identifier.wosWOS:000083162800003
dc.rights.accessRightsAcesso restrito
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Guaratinguetápt
dc.identifier.lattes6100382011052492
unesp.author.lattes6100382011052492
dc.relation.ispartofjcr2.306
dc.relation.ispartofsjr1,814
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