Ba1-xSrxTiO3 thin films by polymeric precursor method
Nenhuma Miniatura disponível
Data
2000-05-01
Autores
Pontes, F. M.
Longo, Elson [UNESP]
Rangel, J. H.
Bernardi, M. I.
Leite, E. R.
Varela, José Arana [UNESP]
Título da Revista
ISSN da Revista
Título de Volume
Editor
Elsevier B.V.
Resumo
Stoichiometric Ba1-xSrxTiO3 (BST; x = 0.4) thin films were prepared by the polymeric precursor method. High quality polycrystalline films of BST with low roughness (approximate to 3 nm) were obtained from a Pt/Ti/SiO2/Si substrate deposited by spin-coating technique. Microstructure and morphological evaluation were done using grazing incident X-ray diffraction (GIXRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Grazing incident angle XRD characterization of these films showed that BST phase crystallizes at 600 degrees C from an inorganic amorphous matrix. No intermediate crystalline phase was identified. A linear relationship between roughness and grain size was observed. (C) 2000 Elsevier B.V. B.V. All rights reserved.
Descrição
Palavras-chave
Ba1-xSrxTiO3, spin-coating, polymeric precursor method
Como citar
Materials Letters. Amsterdam: Elsevier B.V., v. 43, n. 5-6, p. 249-253, 2000.