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dc.contributor.authorChinaglia, D. L.
dc.contributor.authorHessel, R.
dc.contributor.authorOliveira, O. N.
dc.identifier.citationPolymer Degradation and Stability. Oxford: Elsevier B.V., v. 74, n. 1, p. 97-101, 2001.
dc.description.abstractThe polymer surface degradation and/or modification evolution of Teflon FEP and Mylar C films caused by a low energy electron beam were analyzed using a new method that consists in measuring the second crossover energy shift in the electronic emission curve. Upon prolonged irradiation, the second crossover energy shifts irreversibly to lower values in Teflon FEP but to higher values in Mylar C, indicating distinct mechanisms of surface degradation for the two polymers. The method represents a relatively inexpensive way to monitor early stages of surface degradation since the secondary electron emission comes from a maximum depth below the geometric surface of 100 mn in insulators. (C) 2001 Elsevier B.V. Ltd. All rights reserved.en
dc.publisherElsevier B.V.
dc.relation.ispartofPolymer Degradation and Stability
dc.sourceWeb of Science
dc.subjectpolymer degradationpt
dc.subjectelectron beam irradiationpt
dc.subjectsecondary electronspt
dc.titleUsing shifts in the electronic emission curve to evaluate polymer surface degradationen
dcterms.rightsHolderElsevier B.V.
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.description.affiliationUniv São Paulo, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, Brazil
dc.description.affiliationUniv Estadual Paulista, Dept Fis, IGCE, BR-13500970 Rio Claro, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Dept Fis, IGCE, BR-13500970 Rio Claro, SP, Brazil
dc.rights.accessRightsAcesso restrito
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Geociências e Ciências Exatas, Rio Claropt
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