Correlation of electrical conductivity and other vigor tests with field emergence of soybean seedlings
Nenhuma Miniatura disponível
Data
1999-01-01
Autores
Vieira, Roberval Daiton [UNESP]
Paiva-Aguero, J. A.
Perecin, D. [UNESP]
Bittencourt, S. R M [UNESP]
Título da Revista
ISSN da Revista
Título de Volume
Editor
Resumo
Seeds from six soybean cultivars (Cristalina, IAC 31-Foscarin, IAC-15, UFV-10, IAC-14 and IAS-5) and from five soybean cultivars (IAC 31-Foscarin, IAC-15, IAC-14, IAS-5 and Iguacu) were evaluated in 1993 and 1994, respectively, in terms of physiological seed quality by the mechanical damage (MD), standard germination (SG), accelerated aging (AA), electrical conductivity (EC), and seedling field emergence (FE) tests. Significant correlations were detected between SG, AA and EC and FE. However, in terms of the cultivar or the year, the degree of association among these parameters can change based on the environmental conditions of each year.
Descrição
Palavras-chave
Como citar
Seed Science and Technology, v. 27, n. 1, p. 67-75, 1999.