Nonlinear control system applied to atomic force microscope including parametric errors
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The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique. © 2013 Brazilian Society for Automatics - SBA.
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Atomic force microscopy (AFM), Chaos, Optimal linear feedback control (OLFC), State-dependent Riccati equation (SDRE), Atomic force microscope (AFM), Chaotic motions, Control techniques, Linear feedback control, Parametric errors, Parametric uncertainties, State-dependent Riccati equation, Chaos theory, Feedback control, Optimization, Atomic force microscopy
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Journal of Control, Automation and Electrical Systems, v. 24, n. 3, p. 223-231, 2013.
