Campus de Ilha Solteira PROGRAMA DE PÓS-GRADUAÇÃO EM ENGENHARIA MECÂNICA METODOLOGIAS PARA RECONHECIMENTO DE PADRÕES EM SISTEMAS SHM UTILIZANDO A TÉCNICA DA IMPEDÂNCIA ELETROMECÂNICA (E/M) Camila Gianini Gonsalez FICHA CATALOGRÁFICA Elaborada pela Seção Técnica de Aquisição e Tratamento da Informação Serviço Técnico de Biblioteca e Documentação da UNESP - Ilha Solteira. Gonsalez, Camila Gianini. C639m Metodologias para reconhecimento de padrões em sistemas SHM utilizando a técnica da Impedância Eletromecânica (E/M) / Camila Gianini Gonsalez. -- Ilha Solteira : [s.n.], 2012 116 f. : il. Dissertação (mestrado em Engenharia Mecânica) - Universidade Estadual Paulista. Faculdade de Engenharia de Ilha Solteira. Área de Conhecimento: Mecânica dos Sólidos, 2012 Orientador: Vicente Lopes Junior Co-orientador: Samuel da Silva 1. Materiais piezelétricos. 2. Monitoramento da integridade estrutural. 3. Impedância (Eletricidade). 4. Técnica da impedância eletromecânica. 5. Agrupamento Fuzzy c-means. 6. Análise de variância. 7. Análise de variância (ANOVA). • • • • • • • • • • • • • • M C KS PZTV = v sin ( t)ω I = i sin ( t+ )ω φ Admitância eletro-mecânica acoplada Y = Re(Y) + j Im(Y) 10 20 30 40 50 60 70 80 90 100 0 500 1000 1500 2000 2500 Im pe d an ce M o d u lu s [ ΩΩ ΩΩ ] Frequency [kHz] baseline (25°C) 25°C 65°C 95°C 10 20 30 40 50 60 70 80 90 100 0 50 100 150 200 250 300 350 400 450 Im pe da n ce R ea l P ar t [ ΩΩ ΩΩ ] Frequency [kHz] baseline (25°C) 25°C 65°C 95°C 10 20 30 40 50 60 70 80 90 100 -2500 -2000 -1500 -1000 -500 0 500 Im p ed an ce Im ag in ar y P ar t [ ΩΩ ΩΩ ] Frequency [kHz] baseline (25°C) 25°C 65°C 95°C 0 1 2 3 4 5 0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 Index 1 - Impedance Real part In d ex 2 - Im p ed an ce Im ag in ar y p ar t Cluster 1 - 25°C Cluster 2 - 65°C Cluster 3 - 95°C 0 5 10 15 20 0 20 40 60 80 100 Tests % o f M em b er sh ip in e ac h c lu st er Cluster 1 - 25°C Cluster 2 - 65°C Cluster 3 - 95°C 1st 2nd Nref th 1 2 NT centroid II IR 3 1 2 NT 6000 7000 8000 9000 10000 11000 12000 13000 200 300 400 500 600 700 800 900 1000 1100 Im p ed an ce M o d u lu s [ ΩΩ ΩΩ ] Frequency [Hz] 24°C(Baseline) 40°C 55°C 70° 85°C 100°C 6000 7000 8000 9000 10000 11000 12000 13000 0 100 200 300 400 500 600 700 Im p ed an ce R ea l P ar t [ ΩΩ ΩΩ ] Frequency [Hz] 24°C(Baseline) 40°C 55°C 70° 85°C 100°C 6000 7000 8000 9000 10000 11000 12000 13000 -1000 -900 -800 -700 -600 -500 -400 -300 -200 -100 Im p ed an ce Im ag in ar y P ar t [ ΩΩ ΩΩ ] Frequency [Hz] 24°C(Baseline) 40°C 55°C 70° 85°C 100°C 0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0 0.2 0.4 0.6 0.8 1 1.2 1.4 Sensibility Index - Real Part S en si bi lit y In de x - Im ag in ar y P ar t centroid reference points 1 2 3 4 5 6 0 5 10 15 20 25 0 20 40 60 80 100 clusterReference Point pc i ( % ) 0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0 0.25 0.5 0.75 1 1.25 1.5 Sensibility Index - Real Part S en si bi lit y In de x - Im ag in ar y P ar t 0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0 0.25 0.5 0.75 1 1.25 1.5 Sensibility Index - Real Part S en si bi lit y In de x - Im ag in ar y P ar t 0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0 0.25 0.5 0.75 1 1.25 1.5 Sensibility Index - Real Part S en si bi lit y In de x - Im ag in ar y P ar t • • • • • • 10 15 20 25 30 35 40 0 500 1000 1500 Im p ed an ce M o d u lu s [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 20 40 60 80 100 Im p ed an ce R ea l P ar t [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 -1500 -1000 -500 0 Im p ed an ce I m ag in ar y P ar t [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 -0.2 -0.15 -0.1 -0.05 0 Im p ed an ce P h as e [r ad ] Frequency [kHz] 10 15 20 25 30 35 40 0 500 1000 1500 Im p ed an ce M o d u lu s [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 20 40 60 80 Im p ed an ce R ea l P ar t [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 -1500 -1000 -500 0 Im p ed an ce I m ag in ar y P ar t [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 -0.2 -0.15 -0.1 -0.05 0 Im p ed an ce P h as e [r ad ] Frequency [kHz] 10 15 20 25 30 35 40 0 500 1000 1500 Im p ed an ce M o d u lu s [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 20 40 60 80 100 Im p ed an ce R ea l P ar t [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 -1500 -1000 -500 0 Im p ed an ce I m ag in ar y P ar t [ ΩΩ ΩΩ ] Frequency [kHz] 10 15 20 25 30 35 40 -0.2 -0.15 -0.1 -0.05 0 Im p ed an ce P h as e [r ad ] Frequency [kHz] 0 5 10 15 20 25 0 0.01 0.02 0.03 0.04 R M S D ( M o d u lu s) Samples 0 5 10 15 20 25 0 0.05 0.10 0.15 0.20 R M S D ( R ea l P ar t) Samples 0 5 10 15 20 25 0 0.01 0.02 0.03 0.04 R M S D ( Im ag in ar y P ar t) Samples 0 5 10 15 20 25 0 0.005 0.010 R M S D ( P h as e) Samples 0 5 10 15 20 25 0 0.01 0.02 0.03 0.04 R M S D ( M o d u lu s) Samples 0 5 10 15 20 25 0 0.05 0.10 0.15 0.20 R M S D ( R ea l P ar t) Samples 0 5 10 15 20 25 0 0.01 0.02 0.03 0.04 R M S D ( Im ag in ar y P ar t) Samples 0 5 10 15 20 25 0 0.005 0.010 R M S D ( P h as e) Samples 0 5 10 15 20 25 0 0.01 0.02 0.03 0.04 R M S D ( M o d u lu s) Samples 0 5 10 15 20 25 0 0.05 0.10 0.15 0.20 R M S D ( R ea l P ar t) Samples 0 5 10 15 20 25 0 0.01 0.02 0.03 0.04 R M S D ( Im ag in ar y P ar t) Samples 0 5 10 15 20 25 0 0.005 0.010 R M S D ( P h as e) Samples 0 5 10 15 20 25 -0.04 -0.02 0 0.02 0.04 R es id u e (M o d u lu s) Samples p 0 5 10 15 20 25 -0.10 -0.05 0 0.05 0.10 R es id u e (R ea l P ar t) Samples 0 5 10 15 20 25 -0.050 -0.025 0 0.025 0.050 R es id u e (I m ag in ar y P ar t) Samples 0 5 10 15 20 25 -0.006 -0.003 0 0.003 0.006 R es id u e (P h as e) Samples 0 5 10 15 20 25 -0.04 -0.02 0 0.02 0.04 R es id u e (M o d u lu s) Samples 0 5 10 15 20 25 -0.10 -0.05 0 0.05 0.10 R es id u e (R ea l P ar t) Samples 0 5 10 15 20 25 -0.050 -0.025 0 0.025 0.050 R es id u e (I m ag in ar y P ar t) Samples 0 5 10 15 20 25 -0.006 -0.003 0 0.003 0.006 R es id u e (P h as e) Samples 0 5 10 15 20 25 -0.04 -0.02 0 0.02 0.04 R es id u e (M o d u lu s) Samples 0 5 10 15 20 25 -0.10 -0.05 0 0.05 0.10 R es id u e (R ea l P ar t) Samples 0 5 10 15 20 25 -0.050 -0.025 0 0.025 0.050 R es id u e (I m ag in ar y P ar t) Samples 0 5 10 15 20 25 -0.006 -0.003 0 0.003 0.006 R es id u e (P h as e) Samples 0 0.01 0.02 0.03 0.04 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.05 0.10 0.15 0.20 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.01 0.02 0.03 0.04 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.0025 0.0050 0.0075 0.0100 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.01 0.02 0.03 0.04 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.05 0.10 0.15 0.20 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.01 0.02 0.03 0.04 Repaired Structure Damaged Structure Healthy Structure RMSD -0.001 0 0.001 0.002 0.003 0.004 0.005 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.01 0.02 0.03 0.04 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.05 0.10 0.15 0.20 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.01 0.02 0.03 0.04 Repaired Structure Damaged Structure Healthy Structure RMSD 0 0.0025 0.0050 0.0075 0.0100 Repaired Structure Damaged Structure Healthy Structure RMSD • • • • • • • • • • Proceedings… Proceedings… FOLHA DE ROSTO FICHA CATALOGRÁFICA COMISSÃO EXAMINADORA DEDICATÓRIA AGRADECIMENTOS EPÍGRAFE RESUMO ABSTRACT LISTA DE FIGURAS LISTA DE TABELAS LISTA DE SÍMBOLOS SUMÁRIO 1 INTRODUÇÃO 2 INTRODUÇÃO TEÓRICA E REVISÃO BIBLIOGRÁFICA 3 RECONHECIMENTO DE PADRÕES CONSIDERANDO VARIAÇÕES DA TEMPERATURA AMBIENTE 4 RECONHECIMENTO DE PADRÕES USANDO ANÁLISE DE VARIÂNCIA CONSIDERAÇÕES FINAIS REFERÊNCIAS APÊNDICE