Oliveira, José Brás Barreto de [UNESP]Meneses, E. A.Da Silva, E. C F2014-05-272014-05-271999-12-01Physical Review B - Condensed Matter and Materials Physics, v. 60, n. 3, p. 1519-1522, 1999.0163-1829http://hdl.handle.net/11449/65940In this work we analyze the relation between the interface microroughness and the full width at half maximum (FWHM) of the photoluminescence (PL) spectra for a GaAs/Ga0.7Al0.3As multiple quantum well (QW) system. We show that, in spite of the complex correlation between the microscopic interface-defects parameters and the QW optical properties, the Singh and Bajaj model [Appl. Phys. Lett. 44, 805 (1984)] provides a good quantitative description of the excitonic PL-FWHM. ©1999 The American Physical Society.1519-1522engArtigo10.1103/PhysRevB.60.1519WOS:000081551500025Acesso aberto2-s2.0-00006222602-s2.0-0000622260.pdf6977466698742311