Phase-Locked Loop design applied to frequency-modulated atomic force microscope

Bueno, Atila MadureiraBalthazar, José Manoel [UNESP]Castilho Piqueira, Jose Roberto2013-09-302014-05-202013-09-302014-05-202011-09-01Communications In Nonlinear Science and Numerical Simulation. Amsterdam: Elsevier B.V., v. 16, n. 9, p. 3835-3843, 2011.1007-5704http://hdl.handle.net/11449/24909The atomic force microscope (AFM) introduced the surface investigation with true atomic resolution. In the frequency modulation technique (FM-AFM) both the amplitude and the frequency of oscillation of the micro-cantilever must be kept constant even in the presence of tip-surface interaction forces. For that reason, the proper design of the Phase-Locked Loop (PLL) used in FM-AFM is vital to system performance. Here, the mathematical model of the FM-AFM control system is derived considering high order PLL In addition a method to design stable third-order Phase-Locked Loops is presented. (C) 2010 Elsevier B.V. All rights reserved.3835-3843engFrequency-modulated atomic force microscopyPhase-Locked LoopsNonlinear dynamicsMathematical modelPhase-Locked Loop design applied to frequency-modulated atomic force microscopeArtigo10.1016/j.cnsns.2010.12.018WOS:000290368700040Acesso restrito