Bleicher, L.Sasaki, J. M.Oliveira, C.Santos, P.2014-05-202014-05-202000-08-01Journal of Applied Crystallography. Hoboken: Wiley-blackwell, v. 33, p. 1189-1189, 2000.0021-8898http://hdl.handle.net/11449/356611189-1189enggraphical interfaceRietveld refinement programDevelopment of a graphical interface for the Rietveld refinement program DBWSArtigo10.1107/S0021889800005410WOS:000088363000031Acesso restrito