Nozaki, RicardoNavarro, Helio A.Brasil, ReyolandoPereira da Silva, Marcelo A.Tusset, Angelo M.Bueno, Atila M. [UNESP]Balthazar, Jose M. [UNESP]ASME2018-11-272018-11-272015-01-01Proceedings Of The Asme International Mechanical Engineering Congress And Exposition, 2014, Vol 4a. New York: Amer Soc Mechanical Engineers, 7 p., 2015.http://hdl.handle.net/11449/165229This paper presents results obtained numerically by an experimental approach. The sensor of the atomic force microscope generated cantilever deflections series that were recorded in data files as a function of time and as a function of tip-sample distance. With these series of deflections, we attempted to adjust parameters and refine models of classical oscillators atomic force microscope, making them more sensitive to tip-sample distance, through the method of system identification proposed by [12]. This method allows us to choose any model and, through its analytical solution, compare the results obtained with the experiment. The reconstruction of the state space is done with the intention of observing different phase portraits for different distances between sample-tip.7engTrabalho apresentado em eventoWOS:000379450800046Acesso aberto