Parija, B.Badapanda, T.Rout, S. K.Cavalcante, L. S. [UNESP]Panigrahi, S.Longo, Elson [UNESP]Batista, N. C.Sinha, T. P.2014-05-272014-05-272013-07-01Ceramics International, v. 39, n. 5, p. 4877-4886, 2013.0272-8842http://hdl.handle.net/11449/75760Lead-free solid solutions (1-x)Bi0.5Na0.5TiO 3 (BNT)-xBaZr0.25Ti0.75O3 (BZT) (x=0, 0.01, 0.03, 0.05, and 0.07) were prepared by the solid state reaction method. X-ray diffraction (XRD) and Rietveld refinement analyses of 1-x(BNT)-x(BZT) solid solution ceramic were employed to study the structure of these systems. A morphotropic phase boundary (MPB) between rhombohedral and cubic structures occured at the composition x=0.05. Raman spectroscopy exhibited a splitting of the (TO3) mode at x=0.05 and confirmed the presence of MPB region. Scanning electron microcopy (SEM) images showed a change in the grain shape with the increase of BZT into the BNT matrix lattice. The temperature dependent dielectric study showed a gradual increase in dielectric constant up to x=0.05 and then decrease with further increase in BZT content. Maximum coercive field, remanent polarization and high piezoelectric constant were observed at x=0.05. Both the structural and electrical properties show that the solid solution has an MPB around x=0.05. © 2012 Elsevier Ltd and Techna Group S.r.l.4877-4886engC. Electrical propertyPhase boundariesRaman spectroscopyRietveld refinementHigh piezoelectric constantLead-free piezoelectric ceramicLead-free solid solutionsMorphotropic phase boundariesSolid solution ceramicsSolid state reaction methodStructural and electrical propertiesTemperature dependentPiezoelectric ceramicsSodiumSolid solutionsSolid state reactionsX ray diffractionElectric propertiesArtigo10.1016/j.ceramint.2012.11.080WOS:000318577600018Acesso restrito2-s2.0-84875726065