Pontes, F. M.Leal, S. H.Pizani, P. S.Santos, M. R M CLeite, E. R.Longo, Elson [UNESP]Lanciotti, F.Boschi, T. M.Varela, José Arana [UNESP]2014-05-272014-05-272003-03-01Journal of Materials Research, v. 18, n. 3, p. 659-663, 2003.0884-2914http://hdl.handle.net/11449/67212Strontium-modified lead titanate thin films with composition Pb1-xSrxTiO3 were grown on Pt/Ti/SiO2/Si substrates using the polymeric precursor method. The structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction. The results showed a gradual change from tetragonal to cubic structure, the transition occurring at about x = 0.58. The infrared reflectance spectra showed that the frequency of several peaks decreases as the strontium concentration increases. These features are correlated with a decrease in the tetragonal distortion of the TiO6 octahedra as the strontium concentration increases.659-663engDoping (additives)Fourier transform infrared spectroscopyLead compoundsRaman scatteringStrontiumX ray diffraction analysisSoft chemical techniquesThin filmsStructural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical techniqueArtigo10.1557/JMR.2003.0087WOS:000181411200019Acesso aberto2-s2.0-00386762832-s2.0-0038676283.pdf