Astorga, Oscar Armando Maldonado [UNESP]do Prado, Afonso Jose [UNESP]2014-05-272014-05-271994-12-01Conference Record of IEEE International Symposium on Electrical Insulation, p. 546-549.0164-2006http://hdl.handle.net/11449/130721Results of the analysis of dynamic behavior of flashover phenomenon on the high voltage-polluted insulators are presented. These results were taken from a mathematical and an experimental model that introduce the variable thickness influence of the layer pollution deposited on the high-voltage insulator surface. Analysis of the flashover was done by way of introducing a variation in the thickness of the channel of Obenaus' model, simulating a layer pollution of variable thickness. The objective was to obtain a better reproduction of the real layer pollution deposited on the insulator that works in the polluted regions. Two types of thickness variations were used: a sudden variation, using a step; and a soft variation, using a ramp; that were put along the way of the discharge. Comparison between the mathematical and experimental models showed that introduction of a ramp makes Obenaus' model more efficient in analyzing behavior of flashover phenomenon.546-549engAlgorithmsComputer simulationElectric dischargesEquivalent circuitsGeometryMathematical modelsFlashover phenomenonHigh voltage polluted insulatorsObenaus modelRampStepVoltage polarityElectric insulatorsTrabalho apresentado em evento10.1109/ELINSL.1994.401397WOS:A1994BA96P00132Acesso aberto2-s2.0-0028564615