Pontes, F. M.Longo, Elson [UNESP]Rangel, J. H.Bernardi, M. I.Leite, E. R.Varela, José Arana [UNESP]2014-05-202014-05-202000-05-01Materials Letters. Amsterdam: Elsevier B.V., v. 43, n. 5-6, p. 249-253, 2000.0167-577Xhttp://hdl.handle.net/11449/35672Stoichiometric Ba1-xSrxTiO3 (BST; x = 0.4) thin films were prepared by the polymeric precursor method. High quality polycrystalline films of BST with low roughness (approximate to 3 nm) were obtained from a Pt/Ti/SiO2/Si substrate deposited by spin-coating technique. Microstructure and morphological evaluation were done using grazing incident X-ray diffraction (GIXRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Grazing incident angle XRD characterization of these films showed that BST phase crystallizes at 600 degrees C from an inorganic amorphous matrix. No intermediate crystalline phase was identified. A linear relationship between roughness and grain size was observed. (C) 2000 Elsevier B.V. B.V. All rights reserved.249-253engBa1-xSrxTiO3spin-coatingpolymeric precursor methodArtigo10.1016/S0167-577X(99)00268-2WOS:000086724200007Acesso restrito