Mendes, R. G. [UNESP]Araújo, Eudes B. [UNESP]Eiras, J. A. [UNESP]2014-05-272014-05-272001-10-01Journal of Materials Research, v. 16, n. 10, p. 3009-3013, 2001.0884-2914http://hdl.handle.net/11449/66590Strontium barium niobate (SBN) thin films were crystallized by conventional electric furnace annealing and by rapid-thermal annealing (RTA) at different temperatures. The average grain size of films was 70 nm and thickness around 500 nm. Using x-ray diffraction, we identified the presence of polycrystalline SBN phase for films annealed from 500 to 700 °C in both cases. Phases such as SrNb2O6 and BaNb2O6 were predominantly crystallized in films annealed at 500 °C, disappearing at higher temperatures. Dielectric and ferroelectric parameters obtained from films crystallized by conventional furnace and RTA presented essentially the same values.3009-3013engCrystallizationElectric furnacesMetallorganic chemical vapor depositionPermittivityRapid thermal annealingScanning electron microscopyStrontium compoundsX ray diffraction analysisMetallic ionsThin filmsArtigo10.1557/JMR.2001.0413WOS:000171429600039Acesso aberto2-s2.0-00354947252-s2.0-0035494725.pdf