Bordallo, Caio C. M.Martino, Joao AntonioAgopian, Paula G. D. [UNESP]Alian, AlirezaMols, YvesRooyackers, RitaVandooren, AnneVerhulst, Anne S.Simoen, EddyClaeys, CorCollaert, Nadine2018-11-262018-11-262017-09-01Ieee Transactions On Electron Devices. Piscataway: Ieee-inst Electrical Electronics Engineers Inc, v. 64, n. 9, p. 3588-3593, 2017.0018-9383http://hdl.handle.net/11449/159674The basic analog parameters of three splits of InxGa1 - xAs nTFETs are analyzed for the first time. The first two splits are In0.53Ga0.47As devices with a 3-nm HfO2/1-nm Al2O3 and a 2-nm HfO2/1-nm Al2O3, while the last one is an In0.7Ga0.3As channel with a 3-nm HfO2/1-nm Al2O3 gate. The lowequivalentoxide thicknessimproves the electrostatic coupling, enhancing I-DS, and, consequently, also gm and A(V), especially for higher V-GS. The InGaAs tunnel field-effect transistors (TFETs) show compatible performance with Si TFETs, and have better performance than Si MOSFETs, making them useful for low-power and lowvoltage analog applications. The highest efficiency is found using the combination of a 2-nm HfO2 with In0.53Ga0.47As, due to the 56-mV/dec subthreshold swing obtained. For all splits, the A(V) peak can be related to the V-GS necessary for band-to-band tunneling to become the dominant transport mechanism.3588-3593engAnalog parameterscurrent conduction mechanismsintrinsic voltage gainsub-60 mV/dectunnel field-effect transistors (TFET)Artigo10.1109/TED.2017.2721110WOS:000408118700010Acesso abertoWOS000408118700010.pdf04969095954656960000-0002-0886-7798