Santos, L. F.Chinaglia, D. L.Faria, R. M.2014-05-202014-05-201999-05-01Synthetic Metals. Lausanne: Elsevier B.V. Sa, v. 101, n. 1-3, p. 484-485, 1999.0379-6779http://hdl.handle.net/11449/37660Fast transient current decay was recorded on POMA samples during current pulses (in the order of milliseconds) provided by a low energy electron beam under an applied field. The characteristic time decay depends on the electron beam energy and on the bias polarity. The results were explained taking into account the effect of space charge, the intrinsic conductivity of the non-irradiated region of the sample and the radiation-induced conductivity of the thin irradiated region. Fitting parameters may provide the value of both intrinsic and radiation-induced conductivities and the average electron range.484-485engcharge transport measurementselectron beamconductivitypolyaniline and derivativesTransient current effects on poly(o-methoxyaniline) films irradiated by pulsed electron beamArtigo10.1016/S0379-6779(98)01242-9WOS:000081101300234Acesso restrito