Barriga, Gladys D.C. [UNESP]Ho, Linda LeeCancho, Vicente G.2014-05-272014-05-272008-07-08International Journal of Quality and Reliability Management, v. 25, n. 6, p. 636-653, 2008.0265-671Xhttp://hdl.handle.net/11449/70475Purpose - The purpose of this paper is to present designs for an accelerated life test (ALT). Design/methodology/approach - Bayesian methods and simulation Monte Carlo Markov Chain (MCMC) methods were used. Findings - In the paper a Bayesian method based on MCMC for ALT under EW distribution (for life time) and Arrhenius models (relating the stress variable and parameters) was proposed. The paper can conclude that it is a reasonable alternative to the classical statistical methods since the implementation of the proposed method is simple, not requiring advanced computational understanding and inferences on the parameters can be made easily. By the predictive density of a future observation, a procedure was developed to plan ALT and also to verify if the conformance fraction of the manufactured process reaches some desired level of quality. This procedure is useful for statistical process control in many industrial applications. Research limitations/implications - The results may be applied in a semiconductor manufacturer. Originality/value - The Exponentiated-Weibull-Arrhenius model has never before been used to plan an ALT. © Emerald Group Publishing Limited.636-653engMonte Carlo methodsProduction processesSemiconductorsArtigo10.1108/02656710810881926Acesso restrito2-s2.0-46249125874