Araujo, E. B. [UNESP]Melo, M. [UNESP]Ivanov, M.Shur, V. Ya.Kholkin, A. L.2019-10-042019-10-042018-01-01Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 533, n. 1, p. 10-18, 2018.0015-0193http://hdl.handle.net/11449/185482Thickness dependence of imprint and polarization dynamics of Pb1-xLax(Zr1-yTiy)(1-x/4)O-3 (PLZT) thin films is reported in this work. Asymmetries in the histograms of the local piezoresponse reveal an imprint effect in the studied films whose origin could be associated to Schottky barriers near the film-substrate interface. Time-resolved spectroscopic measurements shows that the local polarization relaxation follows the exponential dependence . A maximum relaxation time approximate to 2.18s was observed for the 350nm thick film. A similar thickness dependence between grain size, correlation length () and relaxation time () suggest an intrinsic relationship between them.10-18engPLZTpolarization relaxationthin filmsArtigo10.1080/00150193.2018.1470821WOS:000459872300003Acesso aberto