Malmonge, L. F. [UNESP]Mattoso, L. H C2014-05-272014-05-272000-11-01Polymer, v. 41, n. 23, p. 8387-8391, 2000.0032-3861http://hdl.handle.net/11449/66271The thermal behavior of blends of poly(vinylidene fluoride), or PVDF, and poly(o-methoxyaniline) doped with toluene sulfonic acid was studied by thermogravimetic analysis, electrical conductivity measurements, differential scanning calorimetry, X-ray diffraction and scanning electron microscopy. Blends with thermal and electrical conductivity stabler than the conductive polymer alone were obtained. Nevertheless, degradation occurs after a long period of time (500 h) at high temperatures. The possible association of the conductivity decay with dopant loss, degradation and structural and morphological changes of the blend is discussed. (C) 2000 Elsevier Science Ltd.The thermal behavior of blends of poly(vinylidene fluoride), or PVDF, and poly(o-methoxyaniline) doped with toluene sulfonic acid was studied by thermogravimetic analysis, electrical conductivity measurements, differential scanning calorimetry, X-ray diffraction and scanning electron microscopy. Blends with thermal and electrical conductivity stabler than the conductive polymer alone were obtained. Nevertheless, degradation occurs after a long period of time (500 h) at high temperatures. The possible association of the conductivity decay with dopant loss, degradation and structural and morphological changes of the blend is discussed.8387-8391engBlendsConducting polymersPolyanilinesConductive plasticsDifferential scanning calorimetryElectric conductivity measurementFluorine containing polymersMorphologyScanning electron microscopyThermal conductivity of solidsThermogravimetric analysisVinyl resinsX ray diffraction analysisPolymethoxyanilinePolyvinylidene fluorideSulfonic acidPolymer blendsaniline derivativepolymersulfonic acid derivativetoluene derivativevinylidene fluoridechemical structuredegradationdifferential scanning calorimetryelectric conductivityhigh temperaturemolecular stabilitypolymerizationscanning electron microscopythermal analysisthermogravimetryX ray diffractionblendingcalorimetryelectrical conductivitythermal conductivityX-ray analysisArtigo10.1016/S0032-3861(00)00182-8WOS:000088375900025Acesso restrito2-s2.0-03430815021016869974988190