Mota, Rogério Pinto [UNESP]De Campos, ElsonMarins, Eleasar M.Lucena, Emerson F.Melo, Francisco C. L.Algatti, Mauricio A. [UNESP]2014-05-272014-05-272013-07-01Journal of Superconductivity and Novel Magnetism, v. 26, n. 7, p. 2529-2531, 2013.1557-19391557-1947http://hdl.handle.net/11449/75745Surface defects are extremely important in mechanical characterization of several different materials. Therefore, the analysis of surface finishing is essential for a further simulation of surface mechanical properties in a customized project in materials science and technology. One of the methods commonly employed for such purpose is the statistical mapping of different sample surface regions using the depth from focus technique. The analysis is usually performed directly from the elevation maps which are obtained from the digital image processing. In this paper, the possibility of quantifying the surface heterogeneity of Silicon Carbide porous ceramics by elevation map histograms is presented. The advantage of this technique is that it allows the qualitative or quantitative verification of all surface image fields that cannot be done by using the Surface Plot plugin of image J™ platform commonly used in digital image processing. © 2012 Springer Science+Business Media, LLC.2529-2531engDepth from focusElevation mapHistogramSurfaceElevation mapsMaterials science and technologyMechanical characterizationsQuantitative verificationSurface heterogeneitiesSurface mechanical propertiesCharacterizationGraphic methodsImage processingMechanical propertiesSilicon carbideStatistical methodsSurfacesArtigo10.1007/s10948-012-1699-6WOS:000323923800035Acesso restrito2-s2.0-848791246689585258374949244