Morais, E. A. [UNESP]Scalvi, Luis Vicente de Andrade [UNESP]Ravaro, L. P. [UNESP]Li, Siu M.Floriano, E. A. [UNESP]2014-05-272014-05-272010-12-01Journal of Physics: Conference Series, v. 249.1742-65881742-6596http://hdl.handle.net/11449/72009Photoluminescence and photo-excited conductivity data as well as structural analysis are presented for sol-gel SnO2 thin films doped with rare earth ions Eu3+ and Er3+, deposited by sol-gel-dip-coating technique. Photoluminescence spectra are obtained under excitation with various types of monochromatic light sources, such as Kr+, Ar+ and Nd:YAG lasers, besides a Xe lamp plus a selective monochromator with UV grating. The luminescence fine structure is rather different depending on the location of the rare-earth doping, at lattice symmetric sites or segregated at the asymmetric grain boundary layer sites. The decay of photo-excited conductivity also shows different trapping rate depending on the rare-earth concentration. For Er-doped films, above the saturation limit, the evaluated capture energy is higher than for films with concentration below the limit, in good agreement with the different behaviour obtained from luminescence data. For Eu-doped films, the difference in the capture energy is not so evident in these materials with nanoscocopic crystallites, even though the luminescence spectra are rather distinct. It seems that grain boundary scattering plays a major role in Eu-doped SnO2 films. Structural evaluation helps to interpret the electro-optical data. © 2010 IOP Publishing Ltd.engConductivity dataDip coating techniquesDoped filmsElectro-opticalEr-dopedFine structuresGrain boundary scatteringLuminescence spectrumMonochromatic lightND : YAG lasersPhotoluminescence spectrumRare earth ionsRare-earth dopingStructural evaluationTrapping rateTrivalent ionXe lampBuilding materialsDefectsDoping (additives)ErbiumEuropiumGelsGrain boundariesGrain size and shapeInsulating materialsKryptonLight sourcesMetal ionsMonochromatorsNeodymium lasersPhotoluminescenceSol-gel processSol-gelsSolsStructural analysisTransport propertiesXenonFilmsTrabalho apresentado em evento10.1088/1742-6596/249/1/012005Acesso aberto2-s2.0-7865107138477307194764512320000-0001-5762-6424