Geraldo, V.Briois, V.Scalvi, Luis Vicente de Andrade [UNESP]Santilli, C. V.2014-05-202014-05-202007-01-01Journal of the European Ceramic Society. Oxford: Elsevier B.V., v. 27, n. 13-15, p. 4265-4268, 2007.0955-2219http://hdl.handle.net/11449/37457The effect of Sb doping in SnO2 thin films prepared by the sol-gel dip-coating (SGDC) process is investigated. Electronic and structural properties are evaluated through synchrotron radiation measurements by EXAFS and XANES. These data indicate that antimony is in the oxidation state W, and replaces tin atoms (Sn4+), at a grain surface site. Although the substitution yields net free carrier concentration, the electrical conductivity is increased only slightly, because it is reduced by the high grain boundary scattering. The overall picture leads to a shortening of the grain boundary potential, where oxygen vacancies compensate for oxygen adsorbed species, decreasing the trapped charge at grain boundary. (c) 2007 Elsevier Ltd. All rights reserved.4265-4268engEXAFStin dioxide filmssol-gelEXAFS investigation on Sb incorporation effects to electrical transport in SnO2 thin films deposited by sot-gelArtigo10.1016/j.jeurceramsoc.2007.02.137WOS:000248822800147Acesso restrito773071947645123255842986818708650000-0001-5762-64240000-0002-8356-8093